| Citation: | DING Meng-yu, YUAN Ming-jia, ZHANG Lei. Same-path dual-wavelength image plane digital holography for long-distance topographic measurements[J]. Chinese Optics. doi: 10.37188/CO.EN-2025-0008
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The dual-wavelength image plane digital holography is employed to achieve the long-distance topography measurements, which is expected for the Examination and Analysis System Technology (EAST) in divertor surface monitoring. The same-path design for the illumination and imaging beams is suitable for the upper diagnosis channel of the tokamak device. By selecting two wavelengths with a gap of 1.02 nm, the measurement range of system is extended to 276.87 µm, allowing for 138.44 µm gradient measurements. Experimental results demonstrate that the measurement error of the system for a step with a nominal high of 80 μm is 7.00%, with a minimum detectable height variation of 10 μm. Furthermore, confirm the long-distance measurement capability of the system, and off-line measurements were conducted on a dismantled divertor from a tokamak device. Which proves the system can be applied to the topography measurements of the divertor.
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