Volume 14 Issue 5
Sep.  2021
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WANG Feng-pu, LI Xin-nan, XU Chen, HUANG Ya. Optical testing path design for LOT aspheric segmented mirrors with reflective-diffractive compensation[J]. Chinese Optics, 2021, 14(5): 1184-1193. doi: 10.37188/CO.2020-0218
Citation: WANG Feng-pu, LI Xin-nan, XU Chen, HUANG Ya. Optical testing path design for LOT aspheric segmented mirrors with reflective-diffractive compensation[J]. Chinese Optics, 2021, 14(5): 1184-1193. doi: 10.37188/CO.2020-0218

Optical testing path design for LOT aspheric segmented mirrors with reflective-diffractive compensation

doi: 10.37188/CO.2020-0218
Funds:  Supported by National Natural Science Foundation of China (No. 11627804)
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  • Corresponding author: xnli@niaot.ac.cn
  • Received Date: 28 Dec 2020
  • Rev Recd Date: 07 Jan 2021
  • Available Online: 27 Mar 2021
  • Publish Date: 18 Sep 2021
  • In order to achieve high precision surface testing for the large diameter and long focal length off-axis segmented mirrors, we designed a reflective diffractive compensation null testing system. Using a computer-generated hologram and a spherical mirror to compensate for normal aberration of the off-axis mirror. The design results show that the residual wavefront error of the optical path is close to zero. For a testing system, CGH alignment optical paths corresponding to the non-axisymmetric off-axis structure are designed to ensure the feasibility of the assembly. Parameters of the optical path testing for different off-axis distance mirrors are the same. Rapid high-precision null testing of different types of segmented mirrors can be achieved simply by replacing the CGH at corresponding position and adjusting the spatial positions of the mirror to be measured. Error analysis shows that the RMS error of the mirror surface to be measured is better than λ/40 (λ=632.8 nm), which is caused by the manufacturing error of the compensating elements, misalignment of the optical path, repeatability of the interferometer surface measurement and standard spherical wavefront deviation of the interferometer.

     

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