大型复杂曲面三维形貌测量及应用研究进展

马国庆; 刘丽; 于正林; 曹国华

doi:10.3788/CO.20191202.0214

Volume 12 Issue 2

Apr. 2019

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Chinese Optics > 2019 > 12(2): 214-228.

MA Guo-qing, LIU Li, YU Zheng-lin, CAO Guo-hua. Application and development of three-dimensional profile measurement for large and complex surface[J]. Chinese Optics, 2019, 12(2): 214-228. doi: 10.3788/CO.20191202.0214

Citation:

MA Guo-qing, LIU Li, YU Zheng-lin, CAO Guo-hua. Application and development of three-dimensional profile measurement for large and complex surface[J]. Chinese Optics, 2019, 12(2): 214-228. doi: 10.3788/CO.20191202.0214

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Application and development of three-dimensional profile measurement for large and complex surface

doi: 10.3788/CO.20191202.0214

College of Mechanical and Electrical Engineering, Changchun University of Science and Technology, Changchun 130022, China

Funds:

National High Technology Research and Development Program of China(863 Program) 2015AA7060112

Jilin Scientific and Technological Development Program 20160204016GX

Jilin Provincial Special Funds for Industrial Innovation 2016C088

Jilin Provincial Special Funds for Industrial Innovation 2017C045-2

Young Scientist Fund of Changchun University of Science and Technology XQNJJ-2016-04

More Information

Corresponding author: MA Guo-qing, E-mail:magq@cust.edu.cn
Received Date: 20 Mar 2018
Rev Recd Date: 09 Apr 2018
Publish Date: 01 Apr 2019

Abstract

Abstract

Because of the large spatial scale and complex structure, the large curved complex surface is more difficult to measure and detect. The three-dimensional profile measurement technology provides the technical support for deviation controlling and reverse engineering of the large complex surface due to its high resolution and fast data acquisition. Advances in large and complex three-dimensional surface topography measurement are reviewed and the current means of implementing to large complex three-dimensional surface topography measurements are discussed. Then characteristics and applications of current and future instruments used for large complex surface 3D profile measurement are summarized, and the advantages and disadvantages of each measuring device are compared. This paper provides a reference for the three-dimensional profile measurement devices that are currently widely used. There is special focus given to the acquisition method and processing methods for the 3D point cloud, the pretreatment methods and splicing methods of point cloud are summarized. Finally, the three-dimensional profile measurement technology applications are analyzed. The author believes that future research will focus on the large complex surface topography sensors toward non-contact, automated direction. In the development process, point clouds registration based on the global coordinate, non-adherent point measurement will also become the main direction of the research.
- large complex surfaces,
- three-dimensional profile,
- clouds registration,
- clouds match

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References(51)

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