用于智能移动设备的条纹反射法检测系统

冀翼; 张学军; 袁婷; 陶小平

doi:10.3788/CO.20171002.0267

Volume 10 Issue 2

Apr. 2017

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Article Contents

Chinese Optics > 2017 > 10(2): 267-279.

JI Yi, ZHANG Xue-jun, YUAN Ting, TAO Xiao-ping. Deflectometry measurement system for smart mobile devices[J]. Chinese Optics, 2017, 10(2): 267-279. doi: 10.3788/CO.20171002.0267

Citation:

JI Yi, ZHANG Xue-jun, YUAN Ting, TAO Xiao-ping. Deflectometry measurement system for smart mobile devices[J]. Chinese Optics, 2017, 10(2): 267-279. doi: 10.3788/CO.20171002.0267

JI Yi, ZHANG Xue-jun, YUAN Ting, TAO Xiao-ping. Deflectometry measurement system for smart mobile devices[J]. Chinese Optics, 2017, 10(2): 267-279. doi: 10.3788/CO.20171002.0267

Citation:

JI Yi, ZHANG Xue-jun, YUAN Ting, TAO Xiao-ping. Deflectometry measurement system for smart mobile devices[J]. Chinese Optics, 2017, 10(2): 267-279. doi: 10.3788/CO.20171002.0267

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Deflectometry measurement system for smart mobile devices

doi: 10.3788/CO.20171002.0267

Key Laboratory of Optical System Advanced Manufacturing Technology, Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun 130033, China

Funds:

National Natural Science Foundation of China 61036015

Received Date: 17 Oct 2016
Rev Recd Date: 02 Dec 2016
Publish Date: 01 Apr 2017

Abstract

Abstract

Deflectometry is a three-dimension surface measurement method using simple equipment. In this paper, deflectometry based on portable devices such as smart phones and tablets is discussed. First, the calibration error and advantages of mobile devices are proposed. Then, according to analysis of the data and errors in experiments, a series of methods, such as camera non-linear calibration, improved phase shift algorithm, grid position calibration, automatic gain adjustment, are introduced to improve the measurement accuracy and stability. Finally, app launched in an iPad is used to test a 105 mm SiC workpiece. Experimental results indicate that the precision of global surface is 33 μm RMS with millimeter scale calibration accuracy. The error is mostly of low frequency, and the sensitivity is rather high in some areas. It proves that deflectometry integrated in smart tablet has the capability of achieving a measurement accuracy of tens of microns without other external equipment.
- shape measurement,
- optical testing,
- fringe reflection,
- portable device

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References(22)

References

[1]	LIGTENBERG F K. The Moiré method-a new experimental method for the determination of moments in small slab models[J]. Proc. SESA, 1954, 12(2):83-98.
[2]	KNAUER M C, KAMINSKI J, HAUSLER G. Phase measuring deflectometry:a new approach to measure specular free-form surfaces[C]. Photonics Europe. International Society for Optics and Photonics, 2004:366-376.
[3]	ROSE P, SURREL Y, BECKER J M. Specific design requirements for a reliable slope and curvature measurement standard[J]. Measurement Science and Technology, 2009, 20(9):095110. doi: 10.1088/0957-0233/20/9/095110
[4]	3D-Shape. A New Method to Measure Specular Free-Form Surfaces[EB/OL].[2016-06-08] http://www.3d-shape.com/produkte/pmd_e.php.
[5]	BOTHE T, LI W, VON KOPYLOW C, et al.. High-resolution 3D shape measurement on specular surfaces by fringe reflection[C]. Photonics Europe. International Society for Optics and Photonics, 2004:411-422.
[6]	SU P, PARKS R E, WANG L, et al.. Software configurable optical test system:a computerized reverse Hartmann test[J]. Applied Optics, 2010, 49(23):4404-4412. doi: 10.1364/AO.49.004404
[7]	HUANG R, SU P, HORNE T, et al.. Optical metrology of a large deformable aspherical mirror using software configurable optical test system[J]. Optical Engineering, 2014, 53(8):085106. doi: 10.1117/1.OE.53.8.085106
[8]	SU P, KHREISHI M A H, SU T, et al.. Aspheric and freeform surfaces metrology with software configurable optical test system:a computerized reverse Hartmann test[J]. Optical Engineering, 2014, 53(3):031305. https://www.deepdyve.com/lp/spie/aspheric-and-freeform-surfaces-metrology-with-software-configurable-U7EzNNMBf3
[9]	SU P, WANG S, KHREISHI M, et al.. SCOTS:a reverse Hartmann test with high dynamic range for Giant Magellan Telescope primary mirror segments[J]. SPIE, 2012, 8450:84500W-9. https://www.researchgate.net/publication/258719485_SCOTS_A_reverse_Hartmann_test_with_high_dynamic_range_for_Giant_Magellan_Telescope_primary_mirror_segments
[10]	赵文川, 范斌, 伍凡, 等.基于PMD的反射镜面检测实验分析[J].光学学报, 2013, 33(1):0112001. doi: 10.3788/AOS ZHAO W CH, FAN B, WU F, et al.. Experimental analysis of reflector test based on phase measuring deflectometry[J]. Acta Optica Sinica, 2013, 33(1):0112001.(in Chinese) doi: 10.3788/AOS
[11]	唐燕, 苏显渝, 刘元坤, 等.基于条纹反射的非球面镜三维面形测量[J].光学学报, 2009, 29(4):965-969. doi: 10.3788/AOS YAN T, XIANYU S, YUANKUN L. Three-dimensional shape measurement of aspheric mirror based on fringe reflection[J]. Acta Optica Sinica, 2009, 29(4):965-969.(in Chinese) doi: 10.3788/AOS
[12]	王华荣, 李彬, 王志峰, 等.基于条纹反射术的槽式抛物面单元镜面形测量[J].光学学报, 2013, 33(1):0112007. doi: 10.3788/AOS WANG H R, LI B, WANG ZH F, et al.. Surface measurement of parabolic trough unit mirror based on fringe reflection[J]. Acta Optica Sinica, 2013, 33(1):0112007.(in Chinese) doi: 10.3788/AOS
[13]	BUTEL G P, SMITH G A, BURGE J H. Deflectometry using portable devices[J]. Optical Engineering, 2015, 54(2):025111. doi: 10.1117/1.OE.54.2.025111
[14]	H USLER G, FABER C, OLESCH E, et al.. Deflectometry vs. interferometry[J]. SPIE, 2013, 8788:87881C-11. https://www.researchgate.net/publication/271480476_Deflectometry_vs_Interferometry
[15]	GOLDSTEIN R, ZEBKER H, WERNER C. Satellite radar interferometry:two-dimensional phase unwrapping[J]. Radio Science, 1988, 23(4):713-720. doi: 10.1029/RS023i004p00713
[16]	FLYNN T J. Consistent 2-D phase unwrapping guided by a quality map[C]. Geoscience and Remote Sensing Symposium, 1996. IGARSS'96, IEEE, 1996, 4:2057-2059.
[17]	张旭, 朱利民.Gamma畸变的相位误差模型与Gamma标定技术[J].光学学报, 2012, 32(4):143-150. http://www.cnki.com.cn/Article/CJFDTOTAL-GXXB201204025.htm ZHANG X, ZHU L M. Phase error model from Gamma distortion and Gamma calibration[J]. Acta Optica Sinica, 2012, 32(4):143-150.(in Chinese) http://www.cnki.com.cn/Article/CJFDTOTAL-GXXB201204025.htm
[18]	OHTSUBO J, FUJIMOTO A. Practical image encryption and decryption by phase-coding technique for optical security systems[J]. Applied Optics, 2002, 41(23):4848-4855. doi: 10.1364/AO.41.004848
[19]	AYUBI G A, DI MARTINO J M, ALONSO J R, et al.. Three-dimensional profiling with binary fringes using phase-shifting interferometry algorithms[J]. Applied Optics, 2011, 50(2):147-154. doi: 10.1364/AO.50.000147
[20]	IULIAN ROSU. Automatic Gain Control (AGC) in Receivers, [EB/OL].[2016-06-08]. http://www.qsl.net/va3iul/Files/Automatic_Gain_Control.pdf.
[21]	陈立伟, 刘涌, 毕国堂, 等.双四步路径相移均值法[J].计算机应用, 2014, 34(6):1830-1833. http://www.cnki.com.cn/Article/CJFDTOTAL-JSJY201406069.htm CHEN L W, LIU Y, BI G T, et al.. Double four-step route phase-shifting average algorithm[J]. J. Computer Applications, 2014, 34(6):1830-1833, 1838.(in Chinese) http://www.cnki.com.cn/Article/CJFDTOTAL-JSJY201406069.htm
[22]	YONG L, DINGFA H, YONG J. Flexible error-reduction method for shape measurement by temporal phase unwrapping:phase averaging method[J]. Applied Optics, 2012, 51(21):4945-4953. doi: 10.1364/AO.51.004945