Volume 17 Issue 3
May  2024
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Article Contents
SHEN Ji, VIACHESLAV V. Zabudsky, CHANG Wei-jing, NA Qi-yue, JIAN Yun-fei, OLEG V. Rikhalsky, OLEKSANDR G. Golenkov, VOLODYMYR P. Reva. Design and application of CCD/EMCCD photoelectronic parameter test system[J]. Chinese Optics, 2024, 17(3): 693-703. doi: 10.37188/CO.EN-2023-0016
Citation: SHEN Ji, VIACHESLAV V. Zabudsky, CHANG Wei-jing, NA Qi-yue, JIAN Yun-fei, OLEG V. Rikhalsky, OLEKSANDR G. Golenkov, VOLODYMYR P. Reva. Design and application of CCD/EMCCD photoelectronic parameter test system[J]. Chinese Optics, 2024, 17(3): 693-703. doi: 10.37188/CO.EN-2023-0016

Design and application of CCD/EMCCD photoelectronic parameter test system

doi: 10.37188/CO.EN-2023-0016
Funds:  Supported by National Science and Technology Major Project from Minster of Science and Technology, China (No. 2018AAA0103100)
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  • Author Bio:

    Shen Ji (1988—), male, born in Haimen, Jiangsu Procince, Master degree, Senior Engineer. He received his master degree form Nanjing University of Science and Technology, Optical Engineering in 2014. He is mainly engaged in research of photoelectric device, module and testing. E-mail: njustshenji@126.com

  • Corresponding author: njustshenji@126.com
  • Received Date: 04 Jul 2023
  • Rev Recd Date: 11 Aug 2023
  • Accepted Date: 28 Aug 2023
  • Available Online: 12 Sep 2023
  • A photoelectrical parameters test system for testing CCD and electron-multiplying charge-coupled device (EMCCD) chips is designed. The test system has automatic and manual modes, and it can test the dark currents, the output amplifier’s responsivity, charge transfer efficiency, charge capacity and other parameters. According to different specifications and structures of CCD/EMCCD devices, we complete the parameter test of wafer or packaged product. The developed system can be used for the testing and sorting for 576 × 288, 640 × 512, 768 × 576, 1024 × 1024, 1280 × 1024 CCD and EMCCD chips.

     

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